Anisotropic micro crystals show high potential for the applications in e.g. microelectronic devices and flexible electronics. Most organic single crystals indicate a highly anisotropic optical behavior. Regarding anisotropic samples, the refractive index depends on the polarization of light and direction of propagation.
Imaging Mueller Matrix Ellipsometry (IMME) is an advanced technique required for the complete and accurate characterization of anisotropic and/or depolarizing samples. By using IMME with a microscope objective lens, the measurement of anisotropic refractive indices and the orientation of the optical axes becomes feasible even on micro-structured thin-film samples such as Black Phosphorous (BP) flakes.
