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Research AFM

Small Sample AFM

We redefine precision in nanoscale research with our Small Sample Atomic Force Microscopes, designed for samples typically under 100 mm × 100 mm. Each system integrates Park’s core AFM technologies to deliver high-resolution, non-contact imaging with exceptional accuracy and ease of use. Tailored to meet diverse research needs and budgets, these AFMs are ideal for materials science and nanoelectronics fields.

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Park FX40

The most advanced AFM for small samples

Park NX10

Proven performance in nanoscale metrology

Park NX7

Accessible nanometrology for academic research

Park FX40 IR

The most advanced AFM with IR spectroscopy for small samples

Park FX40 IR

The most advanced AFM with IR spectroscopy for small samples

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